Full scan design is the only option in terms of scan chain insertion.
- In terms of controllability and observability provided by test point insertion, control points have no impact on observability, and observation points have no impact on controllability.
- SoC debug can be considered as pre-silicon validation, while SoC verification can be considered as post-silicon validation.
- Small delay defects may escape when testing speed is higher than functional speed.
- LBIST and MBIST are the most two common classifications of BIST.