Fault coverage

The yield of a manufacturing process is defined as the fraction of acceptable parts among all parts fabricated [5]. If the number of acceptable parts is 5000, and the number of total parts that are fabricated is 7000; calculate the yield.

  1. Defect level, also known as reject rate, is defined as the fraction of faulty chips among all chips passing the test, which can be expressed as parts per million (PPM) [5]. If the number of faulty chips passing final test is 10, the total number of chips passing final test is 50,000; calculate the defect level.
  2. If each chip has 92% fault coverage and 70% yield, calculate the defect level.
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