(a) If a scan-based design has 6400 scan flip-flops that can be constructed as 100 scan chains each with equal length, the number of test patterns is 5000, and testing clock cycle is 10 ns; what would be the test cycle and test time?
(b) What are the main factors impacting manufacturing cost? How can one reduce the manufacturing cost?
2. What are the differences between full scan design and partial scan design?